National Instruments recently announced the PXIe-5164 oscilloscope. The PXIe-5164 is built on the open, modular PXI architecture, and includes a user programmable FPGA to help aerospace/defence, semiconductor and research/physics applications that require high-voltage measurements and high levels of amplitude accuracy. Elaborating on this product, Steve Warntjes, VP – R&D, NI, said, “PXI oscilloscopes from NI reduce test time, increase channel density, and now, deliver even better measurement flexibility with the combination of high bandwidth, resolution and input voltage.”
He further shared, “Our new PXIe-5164 oscilloscope can make measurements that box instruments just can’t handle. If you want to measure a high-voltage signal of up to 100 Vpp at up to 1 GS/s, you can use the same instrument to see small signal details that would normally be hidden by the noise of the instrument, thanks to the 14-bit ADC.” PXI oscilloscopes deliver the ease of use expected from a box oscilloscope. Engineers can use the interactive soft front panels in NI-SCOPE software to make basic measurements. PXI oscilloscopes are an important part of the NI platform and ecosystem that engineers can use to build smarter test systems. These test systems benefit from more than 600 PXI products ranging from DC to mmWave and feature high-throughput data movement using PCI Express bus interfaces.